1"-2" Wafer Listing
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HS18810
88
1"
N
<100>
1
10
660
711
Test
w/ Rectangle to "U" Shape Notch & 3,000 A° ±5% Thermal Oxide.
8289
75
2"
P
<100>
1
10
254
306
Test
w/ Primary Flat only.
HS4962210
700
2.5"
N
<100>
.14
.23
Ingot
Ground
3" Wafer Listing
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7395
1625
3"
N
<100>
1
10
356
406
Prime
with Primary Flat Only & 3,000 Ang. ±5% Thermal Oxide
8445
200
3"
N
<111>
6
12
245
325
FZ
Test
BC3032
73
3"
N
<111>
.05
.1
300
406
As-cut
Coin-roll
WC3048
150
3"
N
<111>off3-4°
.005
.05
355
405
Prime
SSP w/2 Semi-Std. Flats
BC88996
173
3"
N
<111>off3-4°
>.01
356
406
Epi
Prime , Epi layer= 7.5-10 ohm-cm 20-25µm
NPO7164
625
3"
N
<100>
>20
431
483
DSP
Test w/2 Semi-Std. Flats
WC37192
75
3"
N
<100>
>20
381
483
Test
with Semi Flats
WC37620-NV
100
3"
N
<100>
1
10
356
406
Prime
w/Primary Flat Only
7244-69
1400
3"
P
<100>
.01
.05
Ingot
As-grown.
BC17967
2600
3"
P
<111>
.014
.02
Ingot
Ground & Flatted per U.S. Stds.
WC27806
125
3"
P
<100>
1
10
356
406
Prime
w/2 Semi-Std Flats
7244-1272
2300
3"
P
<111>
<10
Ingot
Ground, Flat & Mounted
WC5201~P1
10
3"
P
<100>
1
10
575
625
DSP
Prime w/Semi-Std. Flats & TTV </= 2.5µm
CP02-11208
325
3"
P
<100>
.001
.005
356
406
Prime
w/2 Semi-Std. Flats
CP17-10041
10200
3"
P
<100>
1
10
Ingot
Ground w/0 Flats or 2 Flats per Semi-Stds.
CA05-11645
475
3"
Any
508
534
3" Any Type, Orientation, Resistivity, 508-534µm Thick As-Cut Non Edge-rounded w/2 Semi-Std. Flats, Rinse SC1 Clean & Dry.
CP03-10685
450
3"
Any
<Any>
Any
575
625
Test
w/2 Semi-Std. Flats
HC40561
28
3"
N/Ph
<110>
Ge
As-cut Edgerounded Wafer w/2 Flats
7244-2718-923
15900
3"
N/Sb
<111>
.005
.05
Ingot
As-grown Ground & Flatted
CA02-10016
3
3"
N(Te)
<100>
480
520
GaAs
Wafer, cc:2.3E18, Mobility: 2370, EPD: 4E4, w/1 Flat & TTV <3µm.
4" Wafer Listing
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HC44001
13
4"
N
<111>
5
50
635
686
Ge
As-cut Wafer
HC44002
15
4"
N
<111>
5
40
762
813
Ge
As-cut Wafer
HC44003
49
4"
N
<111>
5
40
762
813
Ge
As-cut Wafer
HC44004
12
4"
N
<Any>
5
40
1016
1067
Ge
As-cut Coin-rolled Wafer
STK8414
500
4"
N
<100>
1
10
500
550
Prime
w/2 Semi-Std. Flats
4N0-10848
4
4"
N
<100>±1°
>5000
125
160
FZ
DSP w/Primary Flat ,TTV <6µm, Bow/Warp <20µm
4N0-10854
17
4"
N
<100>±1°
>5000
173
187
FZ
Lapped, Etched & Edgerounded, w/Semi-Std. Primary Flat, TTV <6µm, Bow & Warp <20µm
7244-4682-126A
4000
4"
N
<111>
<.020
Ingot
As-grown Phosphorus doped
7358
50
4"
P
<100>
5
25
500
550
Prime
w/2 Semi-Std. Flats
7375
450
4"
P
<100>
1
25
475
575
Test
w/2 Flats, LPD's <30 @.5µm
GC38892
27415
4"
P
<100>
1.3
3.7
Ingot
Ground 1Flat per U.S. Semi-Stds.
HC49138
4400
4"
P
<111>
.0015
.0035
Ingot
Ground, flatted & mounted
HS39626
425
4"
P
<100>
.001
.005
500
550
Prime
w/Semi-Std Flats
SOI11000
7
4"
P
<100>
1
10
280
320
SOI
CZ Handle DSP w/o oxide, Box: 1.4-2.1µm Thermal, Device 1-10 ohm-cm 35-40µm, TTV <10µm
WC673581
100
4"
P
<100>
8
22
365
385
DSP
Prime w/2 Sem-Std. Flats
GC38892-2
7140
4"
P
<100>
1.3
4.1
Ingot
Ground 2 Flats per U.S. Semi-Stds.
STK8414-2
450
4"
P
<100>
1
10
500
550
Prime
w/2 Semi-Std. Flats
HS39626-OX
25
4"
P
<100>
.001
.005
500
550
Prime
w/Semi-Std Flats & Thermal Oxide
4A01-11732
497
4"
x
4" x 4" x 0.70mm Glass Borosilicate Wafer No Bevels, Surface Quality 80/50
HC22001
23
4"
N+
<Any>
.0015
.003
Any
Epi
Layer N w/Any Resistivity & Thickness
7244-6014-859
7500
4"
N+
<100>
Any
Ingot
As-grown, Arsenic doped, Ground & Flatted
5" Wafer Listing
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7479-1
409
5"
N
<100>
1
10
380
405
Etched
Edge-rounded, Coin-rolled w/ 2 Semi-std Flats & LM
EN1-11139
50
5"
N
<111>off2-3°
4
7
600
650
Prime
w/ Primary Flat only
EN03-SOI9554
17
5"
N
<100>±1°
3
10
620
630
SOI
FZ Handle SSP, Box .425-.475µm Thermal Oxide, Device 2.3-2.5 ohm-cm, 19-21µm Thick w/2 Flats
EN03-10345
25
5"
N
<100>±1°
3
10
615
630
Prime
w/Primary Flat Only TTV <2µm, B & W<40
EN03-10346
50
5"
N
<100>±
2.5
5.5
615
635
Prime
w/ Primary Flat Only TTV<2µm, B & W<40
7387
89
5"
P
<100>
42
52.1
725
750
As-cut
w/2 Flats, Primary Flat has V-notch
6416M
4009
5"
P
<100>
.087
.092
Ingot
Ground, Flatted w/2 Flats, V-notch on Primary Flat
73871
44
5"
P
<100>
>100
630
730
Lapped
Edge-rounded Coin-rolled w/2 Flats, Primary Flat has V-notch
7285-2
50
5"
P
<111>
.01
.02
600
650
Prime
w/Primary Flat & Etched backs
7479-3
108
5"
P
<100>
1
10
380
405
Etched
Edge-rounded Coinrolled w/2 Flats & LM
7244-6691-2B
4100
5"
P
<100>
<=.02
Ingot
Ground w/2 Flats
GC211001-4
163
5"
P
<100>
.01
.02
600
700
Etched
Coinrolled w/Primary Flat Only & Oxide backseal
7244-6013-427
2535
5"
N+
<111>
<=.007
Ingot
Ground, Flatted & Mounted, Arsenic doped
7244-6013-633
20524
5"
N+
<111>
.001
.01
Ingot
As-grown Arsenic doped with 3 Flats
6" Wafer Listing
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FA01-9900
4
6"
x.75mm
Pyrex
wafers with Edges Seamed, for Customer Evaluation of Edge Seam vs. Bevel (pencil).
WC109484
1500
6"
N
<110>
1
10
Ingot
Ground w/ U.S. Primary Flat Only
GC38892-5
203335
6"
N
<100>
.025
.07396
Ingot
Ground & 1 Flat per U.S. Semi-Stds., Antimony doped
HS39560-2
50
6"
N
<100>
>1000
1143
1169
FZ
DSP w/Primary Flat Only
FN05-11654
75
6"
N
<100>
0
100
575
700
Test
w/ Primary Flat only.
FN06-11446
25
6"
N
<100>
>1000
1143
1168.4
FZ
DSP w/Primary Flat Only with 3,000 A°±5% Thermal Ox. & 1500A LPCVD SiN (handled w/tweezers)
FP02-10467
9
6"
N
<100>
.008
.02
165
191
Test
w/Primary Flat Only & TTV </= 8µm, Coin-roll w/paper
7448
75
6"
P
<100>
.5
50
645
705
Test
w/ US Primary Flat Only & 2,000 Ang.±5% Thermal Oxide
7467
44
6"
P
<100>
5
30
625
725
Test
w/Primary Flat Only & TTV <10, B & W <60µm Particles <10@.3µm
7296~P1
25
6"
P
<100>
1000
2000
650
700
FZ
DSP
BC38330
981
6"
P
<100>
Any
>=550
Reclaim
GC49266
600
6"
P
<100>
.005
.08
1175
1225
Prime
DSP w/V-Notch per U.S.Semi-Stds. & TTV <3µm.
HS18854
25
6"
P
<100>
1
30
650
700
Prime
w/Std. Notch, TTV <= 5µm
HS38780
75
6"
P
<100>
.5
50
645
705
Test
w/Primary Flat Only & 10,000 A°±5% Thermal Oxide
HS89121
225
6"
P
<100>
0
100
1150
1350
Prime
SSP w/ Std.Notch, TTV <= 3µm
WC78987
325
6"
P
<100>
1
50
650
700
Prime
w/ Primary Flat Only & TTV <5µm
WC99755
25
6"
P
<100>
>1
710
740
Test
w/Primary Flat Only & Etched Backs
FP04-10107
300
6"
P
<100>
0
100
600
700
Test
w/ Notch Only & 3,000 Ang. ± 5% Thermal Oxide
FP06-11973
450
6"
P
<100>
0
100
600
700
Test
w/Primary Flat Only
FP14-12522
100
6"
P
<100>
0
100
600
700
Test
with Std. Notch
FP16-18828
1854
6"
P
<100>
0
100
600
700
6" P <100> 0-100 ohm-cm 600-700µm Thick SSP w/ Notch Only
FP39-12574
150
6"
P
<100>
>3,000
650
700
FZ
Prime SSP w/Primary Flat Only, TTV <5µm
HP01-11598
2100
6"
P
<100>
1
50
650
700
Prime
w/ Primary Flat only & LM on Frontside on Flat.
3162085
6000
6"
Any
<Any>
Any
Ingot
As-grown
STK9281
7745
6"
Any
<Any>
0
100
Any
Etched
Coinrolled with Primary Flat Only.
FA01-11810
150
6"
Any
6" Any Type, Orientation, Resistivity & Thickness with Notch & Surface Defects, Particles <50 @ .5µm
FN02-12565
2
6"
N/Sb
<100>
.025
.074
1325
1375
DSP
Prime w/Primary Flat Only
FP31-12277
24
6"
P/Bo
<100>
<.005
600
650
Test
w/ Primary Flat Only
8" Wafer Listing
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GN16-12341
50
8"
N
<100>
>5000
700
750
FZ
Prime SSP with Std. Notch
IN08-11685
64
8"
N
<100>
1
30
700
750
8" N <100> 1-30 ohm-cm 700-750µm Thick SSP w/Std. Notch & 3,000 A° ± 10% Thermal Oxide
IN08-11860
50
8"
N
<100>
1
30
700
750
8" N <100> 1-30 ohm-cm 700-750µm Thick SSP w/Std. Notch
5196
50
8"
P
<100>
.001
.01
700
750
8" P <100> .001-.01 ohm-cm 700-750µm Thick SSP w/Notch & Frontside Lasermark.
9911
150
8"
P
<100>
9
18
712
762
DSP
w/Std. Notch & LM per U.S. Semi-Std.
7574-1
1825
8"
P
<100>
.5
100
700
750
Test
w/Notch & LM per Semi-Std.
HS18590
150
8"
P
<100>
0
100
760
890
Test
STX10299
25
8"
P
<100>
1
100
700
750
Test
SSP with Flat
STK9500-2
450
8"
P
<100>
1
100
700
750
Prime
SSP w/Std. Notch & LM.
HP01-T200SSP
75
8"
P
<100>
0
100
700
750
Test
w/Std. Notch and backseal
GC19195
10
8"
Any
<100>
0
100
650
750
Test
w/Std. Notch, Particles <100 @.3µm
JK-11811
1050
8"
Any
<100>
0
300
675
775
8" Any Type <100> 0-300 ohm-cm, 675-775µm Thick, SSP with Std. Notch only.
GN18-12648
25
8"
N/As
<100>
.003
.005
700
750
8" N/As <100> .003-.005 ohm-cm 700-750µm Thick SSP with Notch 45° from <110>
12" Wafer Listing
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STK9754
25
12"
P
<100>
1
100
750
800
Prime
w/Std Notch & No LM
PP01-9818
75
12"
P
<100>±1°
1
100
750
800
Litho
w/Std. Notch & Semi-T7 LM
NP01-T300S
350
12"
P
<100>
1
100
750
800
Mechanical
with Notch
Float Zone Wafer Listing
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Ingot Wafer Listing
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HS4962210
700
2.5"
N
<100>
.14
.23
Ingot
Ground
7244-69
1400
3"
P
<100>
.01
.05
Ingot
As-grown.
BC17967
2600
3"
P
<111>
.014
.02
Ingot
Ground & Flatted per U.S. Stds.
7244-1272
2300
3"
P
<111>
<10
Ingot
Ground, Flat & Mounted
CP17-10041
10200
3"
P
<100>
1
10
Ingot
Ground w/0 Flats or 2 Flats per Semi-Stds.
7244-2718-923
15900
3"
N/Sb
<111>
.005
.05
Ingot
As-grown Ground & Flatted
7244-4682-126A
4000
4"
N
<111>
<.020
Ingot
As-grown Phosphorus doped
GC38892
27415
4"
P
<100>
1.3
3.7
Ingot
Ground 1Flat per U.S. Semi-Stds.
HC49138
4400
4"
P
<111>
.0015
.0035
Ingot
Ground, flatted & mounted
GC38892-2
7140
4"
P
<100>
1.3
4.1
Ingot
Ground 2 Flats per U.S. Semi-Stds.
7244-6014-859
7500
4"
N+
<100>
Any
Ingot
As-grown, Arsenic doped, Ground & Flatted
6416M
4009
5"
P
<100>
.087
.092
Ingot
Ground, Flatted w/2 Flats, V-notch on Primary Flat
7244-6691-2B
4100
5"
P
<100>
<=.02
Ingot
Ground w/2 Flats
7244-6013-427
2535
5"
N+
<111>
<=.007
Ingot
Ground, Flatted & Mounted, Arsenic doped
7244-6013-633
20524
5"
N+
<111>
.001
.01
Ingot
As-grown Arsenic doped with 3 Flats
WC109484
1500
6"
N
<110>
1
10
Ingot
Ground w/ U.S. Primary Flat Only
GC38892-5
203335
6"
N
<100>
.025
.07396
Ingot
Ground & 1 Flat per U.S. Semi-Stds., Antimony doped
3162085
6000
6"
Any
<Any>
Any
Ingot
As-grown
Float Zone Wafer Listing
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8445
200
3"
N
<111>
6
12
245
325
FZ
Test
4N0-10848
4
4"
N
<100>±1°
>5000
125
160
FZ
DSP w/Primary Flat ,TTV <6µm, Bow/Warp <20µm
4N0-10854
17
4"
N
<100>±1°
>5000
173
187
FZ
Lapped, Etched & Edgerounded, w/Semi-Std. Primary Flat, TTV <6µm, Bow & Warp <20µm
HS39560-2
50
6"
N
<100>
>1000
1143
1169
FZ
DSP w/Primary Flat Only
FN06-11446
25
6"
N
<100>
>1000
1143
1168.4
FZ
DSP w/Primary Flat Only with 3,000 A°±5% Thermal Ox. & 1500A LPCVD SiN (handled w/tweezers)
7296~P1
25
6"
P
<100>
1000
2000
650
700
FZ
DSP
FP39-12574
150
6"
P
<100>
>3,000
650
700
FZ
Prime SSP w/Primary Flat Only, TTV <5µm
GN16-12341
50
8"
N
<100>
>5000
700
750
FZ
Prime SSP with Std. Notch
Epi Wafer Listing
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BC88996
173
3"
N
<111>off3-4°
>.01
356
406
Epi
Prime , Epi layer= 7.5-10 ohm-cm 20-25µm
HC22001
23
4"
N+
<Any>
.0015
.003
Any
Epi
Layer N w/Any Resistivity & Thickness
SOI (Silicon-On-Insulator) Wafer Listing
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SOI material is used widely in applications such as
telecommunication products and optical devices, dielectrically isolated integrated
circuits, solid state relays and micro-machined components for sensors and actuators.
NOVA offers an innovative and powerful through-wafer interconnect technology which can
allow device designers in both standard IC and MEMS device industries overcome packaging
problems associated with their designs. NOVA offers a fully customized engineered
substrate solution to minimize your fabrication headaches.
Typical Diameters range from 4" to 300mm. Please complete our
Request a Quote form with your specifications so
NOVA can quote your needs!
Epitaxial Wafer Listing
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Epitaxial silicon wafers are made through the precipitation of a
monocrystalline silicon coat. The substratum consists of a polished silicon wafer.
Epitaxial wafers are used for discrete applications and, because of their extraordinary
quality as semiconductors, for the manufacturing of the most progressive and highly
integrated semiconductor construction elements (ICs).
Typical Diameters range from 3" to 300mm. Please complete our
Request a Quote form with your specifications so
NOVA can quote your needs!
Solar Wafer Listing
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NOVA creates significant competitive advantages, in terms of cost
and quality, which are passed through the value chain of the entire silicon-based solar
cell manufacturing market. The resulting single crystal wafers are manufactured and sold
to meet the growing demands of the photovoltaic industry's major solar cell and module
manufacturers, helping to further satisfy rapidly expanding end-user demand currently
growing by 35 percent per year. Because NOVA's sources are designed for very high volume
materials handling, as opposed to traditional precision semiconductor manufacturing that
has been used to service the photovoltaic industry's silicon wafer needs in the past,
NOVA can allow far better utilization of raw silicon feedstock at significantly lower
cost within the supply chain.
Typical Diameters range from 3" to 125mm psuedo square to 300mm. Please contact NOVA's specialist or complete our
Request a Quote form with your specifications so
NOVA can quote your needs!